TY  - RPRT
TI  - Shrinking limits of silicon MOSFET's: Numerical study of 10-nm-scale devices
AU  - Y. Naveh
AU  - K. K. Likharev
PY  - 1999
DO  - 10.1006/spmi.1999.0807
UR  - https://arxiv.org/abs/cond-mat/9910258
ID  - cond-mat/9910258
ER  -