TY  - RPRT
TI  - Determination of the magnetization scaling exponent for single crystal La$_{0.8}$Sr$_{0.2}$MnO$_3$ by broadband microwave surface impedance measurements
AU  - Andrew Schwartz
AU  - Marc Scheffler
AU  - Steven M. Anlage
PY  - 1999
DO  - 10.1103/physrevb.61.r870
UR  - https://arxiv.org/abs/cond-mat/9910481
ID  - cond-mat/9910481
ER  -