TY  - RPRT
TI  - Microscopic modelling of defects production and their annealing after irradiation in silicon for HEP particle detectors
AU  - S. Lazanu
AU  - I. Lazanu
AU  - M. Bruzzi
PY  - 2002
DO  - 10.1016/j.nima.2003.08.078
UR  - https://arxiv.org/abs/hep-ph/0209012
ID  - hep-ph/0209012
ER  -