TY  - RPRT
TI  - Lindhard Factors and Concentrations of Primary Defects in Semiconductor Materials for uses in HEP
AU  - I. Lazanu
AU  - S. Lazanu
PY  - 2003
UR  - https://arxiv.org/abs/hep-ph/0301080
ID  - hep-ph/0301080
ER  -