TY  - RPRT
TI  - Microscopic Estimates for Electromigration Velocities of Intragranular Voids in Aluminum Lines
AU  - L. K. Wickham
AU  - James P. Sethna
PY  - 1996
UR  - https://arxiv.org/abs/mtrl-th/9607015
ID  - mtrl-th/9607015
ER  -