TY  - RPRT
TI  - Two Scale Model for Aggregation and Etching
AU  - George C. John
AU  - Vijay A. Singh
PY  - 1995
DO  - 10.1103/physreve.53.3920
UR  - https://arxiv.org/abs/patt-sol/9512001
ID  - patt-sol/9512001
ER  -