TY  - RPRT
TI  - Annealing of radiation induced defects in silicon in a simplified phenomenological model
AU  - Sorina Lazanu
AU  - Ionel Lazanu
PY  - 2001
DO  - 10.1016/s0168-583x(01)00767-4
UR  - https://arxiv.org/abs/physics/0008077
ID  - physics/0008077
ER  -