@misc{indiciae5fb12a7db44a,
  title = {Statistical Yield Modeling for IC Manufacture: Hierarchical Fault Distributions},
  author = {Yu. I. Bogdanov and N. A. Bogdanova and V. L. Dshkhunyan},
  year = {2003},
  url = {https://arxiv.org/abs/physics/0303039},
  note = {Source identifier: physics/0303039}
}