TY  - RPRT
TI  - Statistical Yield Modeling for IC Manufacture: Hierarchical Fault Distributions
AU  - Yu. I. Bogdanov
AU  - N. A. Bogdanova
AU  - V. L. Dshkhunyan
PY  - 2003
UR  - https://arxiv.org/abs/physics/0303039
ID  - physics/0303039
ER  -