TY  - RPRT
TI  - The dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy
AU  - Hyung-Su Chon
AU  - Gisung Park
AU  - Sang-Bum Lee
AU  - Seokchan Yoon
AU  - Jaisoon Kim
AU  - Jai-Hyung Lee
AU  - Kyungwon An
PY  - 2006
UR  - https://arxiv.org/abs/physics/0411222
ID  - physics/0411222
ER  -