@misc{indiciaefd56789bd7fb,
  title = {An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy},
  author = {M. R. Howells and T. Beetz and H. N. Chapman and C. Cui and J. M. Holton and C. J. Jacobsen and J. Kirz E. Lima and S. Marchesini and H. Miao and D. Sayre and D. A. Shapiro and J. C. H. Spence},
  year = {2005},
  doi = {10.1016/j.elspec.2008.10.008},
  url = {https://arxiv.org/abs/physics/0502059},
  note = {Source identifier: physics/0502059}
}