TY  - RPRT
TI  - Measurement of the thickness of an insensitive surface layer of a PIN photodiode
AU  - Y. Akimoto
AU  - Y. Inoue
AU  - M. Minowa
PY  - 2005
DO  - 10.1016/j.nima.2005.11.158
UR  - https://arxiv.org/abs/physics/0504147
ID  - physics/0504147
ER  -