TY  - RPRT
TI  - Helium 2 3S - 2 1S metrology at 1557 nm
AU  - K. A. H. van Leeuwen
AU  - W. Vassen
PY  - 2006
DO  - 10.1209/epl/i2006-10284-4
UR  - https://arxiv.org/abs/physics/0609087
ID  - physics/0609087
ER  -