TY  - RPRT
TI  - Determination of Atom-Surface van der Waals Potentials from Transmission-Grating Diffraction Intensities
AU  - R. E. Grisenti
AU  - W. Schoellkopf
AU  - J. P. Toennies
AU  - G. C. Hegerfeldt
AU  - T. Koehler
PY  - 1999
DO  - 10.1103/physrevlett.83.1755
UR  - https://arxiv.org/abs/quant-ph/9907053
ID  - quant-ph/9907053
ER  -