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arXiv · 0709.0533

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

Ozgur Sahin
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Abstract

Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force waveform with the use of non-linear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.

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Ozgur Sahin. 2007-09-04. Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements. https://doi.org/10.1063/1.2801009

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