Measurement of Coulomb drag between Anderson insulators

K. Elsayad; J. P. Carini; D. V. Baxter

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arXiv · 0802.4073

Measurement of Coulomb drag between Anderson insulators

K. Elsayad·J. P. Carini·D. V. Baxter

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Abstract

We report observations of the Coulomb drag effect between two effectively 2-d insulating a-Si_{1-x}Nb_{x} films. We find that there only exist a limited range of experimental parameters over which we can measure a sizable linear-response transresistivity (ρ_{d}). The temperature dependence of ρ_{d} is consistent with the layers being Efros-Shklovskii Anderson insulators provided that a 3-d density of states and a localization length smaller than that obtained from the DC layer-conductivity are assumed.

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K. Elsayad, J. P. Carini, D. V. Baxter. 2008-02-27. Measurement of Coulomb drag between Anderson insulators. https://arxiv.org/abs/0802.4073

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