arXiv · 0805.3451
Carrier relaxation in Si/SiO$_2$ quantum dots
Abstract
Carrier relaxation due to both optical and nonradiative intraband transitions in silicon quantum dots in SiO$_2$ has been considered. Interaction of confined holes with optical phonons has been studied. The Huang-Rhys factor is calculated for such transitions. The probability of intraband transition of a confined hole emitting several optical phonons is estimated.
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A. A. Prokofiev, S. V. Goupalov, A. S. Moskalenko, A. N. Poddubny, I. N. Yassievich. 2008-05-22. Carrier relaxation in Si/SiO$_2$ quantum dots. https://doi.org/10.1016/j.physe.2008.08.053
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