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arXiv · 0811.1210

Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology

Xuefeng Wang·Yong P. Chen·David D. Nolte
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Abstract

We apply spinning-disc picometrology to measure the complex refractive index of graphene on thermal oxide on silicon. The refractive index varies from n = 2.4-1.0i at 532 nm to n = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67-1.34i to 2.73-1.42i from 532 nm to 633 nm).

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Xuefeng Wang, Yong P. Chen, David D. Nolte. 2008-11-07. Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology. https://arxiv.org/abs/0811.1210

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