Universal and reconfigurable logic gates in a noise-triggered artificial neuron node

L. Worschech; F. Hartmann; A. Forchel; J. Ahopelto; I. Neri; L. Gammaitoni

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arXiv · 0812.3717

Universal and reconfigurable logic gates in a noise-triggered artificial neuron node

L. Worschech·F. Hartmann·A. Forchel·J. Ahopelto·I. Neri·L. Gammaitoni

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Abstract

Submicron-sized mesas of resonant tunneling diodes (RTDs) with split drain contacts have been realized and the current-voltage characteristics have been studied in the bistable regime at room temperature. Dynamically-biased, the RTDs show noise-triggered firing of spike-like signals and can act as reconfigurable universal logic gates for small voltage changes of a few mV at the input branches. These observations are interpreted in terms of a stochastic nonlinear processes in the split RTD, which are found to be robust against noise. The split RTDs show also gain for the fired-signal bursts, can be easily integrated to arrays of multiple inputs and have thus the potential to mimic neuron nodes in nanoelectronic circuits.

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L. Worschech, F. Hartmann, A. Forchel, J. Ahopelto, I. Neri, L. Gammaitoni. 2008-12-19. Universal and reconfigurable logic gates in a noise-triggered artificial neuron node. https://arxiv.org/abs/0812.3717

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