arXiv · 0908.3541
Level Crossing Rate and Average Fade Duration of the Double Nakagami-m Random Process and Application in MIMO Keyhole Fading Channels
Abstract
We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are then used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.
Explore related subjects
Keep this discovery
Nikola Zlatanov, Zoran Hadzi-Velkov, George K. Karagiannidis. 2009-08-25. Level Crossing Rate and Average Fade Duration of the Double Nakagami-m Random Process and Application in MIMO Keyhole Fading Channels. https://doi.org/10.1109/lcomm.2008.081058
Cite the original work for its findings. Save a collection to share your selection of sources.