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arXiv · 0909.3547

Charge sensing in enhancement mode double-top-gated metal-oxide-semiconductor quantum dots

E. P. Nordberg·H. L. Stalford·R. Young·G. A. Ten Eyck·K. Eng·L. A. Tracy·K. D. Childs·J. R. Wendt·R. K. Grubbs·J. Stevens·M. P. Lilly·M. A. Eriksson·M. S. Carroll
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Abstract

Laterally coupled charge sensing of quantum dots is highly desirable, because it enables measurement even when conduction through the quantum dot itself is suppressed. In this work, we demonstrate such charge sensing in a double top gated MOS system. The current through a point contact constriction integrated near a quantum dot shows sharp 2% changes corresponding to charge transitions between the dot and a nearby lead. We extract the coupling capacitance between the charge sensor and the quantum dot, and we show that it agrees well with a 3D capacitance model of the integrated sensor and quantum dot system.

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E. P. Nordberg, H. L. Stalford, R. Young, G. A. Ten Eyck, K. Eng, L. A. Tracy, K. D. Childs, J. R. Wendt, R. K. Grubbs, J. Stevens, M. P. Lilly, M. A. Eriksson, M. S. Carroll. 2009-09-18. Charge sensing in enhancement mode double-top-gated metal-oxide-semiconductor quantum dots. https://doi.org/10.1063/1.3259416

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