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arXiv · 1001.3350

On the characterization of a random monolayer of particles from coherent optical reflectance

F. Alarcon-Oseguera·M. Pena-Gomar·A. Garcia-Valenzuela·F. Castillo·E. Perez
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Abstract

We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle's radius and surface coverage once the particles are sufficiently large.

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F. Alarcon-Oseguera, M. Pena-Gomar, A. Garcia-Valenzuela, F. Castillo, E. Perez. 2010-01-19. On the characterization of a random monolayer of particles from coherent optical reflectance. https://doi.org/10.1117/12.839606

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