Coaxial Atomic Force Microscope Tweezers

K. A. Brown; J. A. Aguilar; R. M. Westervelt

doi:10.1063/1.3372621

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arXiv · 1001.5262

Coaxial Atomic Force Microscope Tweezers

K. A. Brown·J. A. Aguilar·R. M. Westervelt

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Abstract

We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force vs. applied voltage. We show that the coaxial AFM tweezers (CAT) can perform three dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

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BibTeX RIS

K. A. Brown, J. A. Aguilar, R. M. Westervelt. 2010-01-28. Coaxial Atomic Force Microscope Tweezers. https://doi.org/10.1063/1.3372621

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