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arXiv · 1006.5109

Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer

M. Weides·U. Peralagu·H. Kohlstedt·J. Pfeiffer·M. Kemmler·C. Gürlich·E. Goldobin·D. Koelle·R. Kleiner
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Abstract

We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses $d_1$ and $d_2$ in both halves were varied to obtain different combinations of positive and negative critical current densities $j_{c,1}$ and $j_{c,2}$. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.

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M. Weides, U. Peralagu, H. Kohlstedt, J. Pfeiffer, M. Kemmler, C. Gürlich, E. Goldobin, D. Koelle, R. Kleiner. 2010-07-15. Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer. https://doi.org/10.1088/0953-2048%2F23%2F9%2F095007

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