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arXiv · 1007.0344

Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam

Georgios Ctistis·Alex Hartsuiker·Edwin van der Pol·Julien Claudon·Willem L. Vos·Jean-Michel Gérard
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Abstract

We have performed white-light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from 1 μm up to 20 μm. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements.

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Georgios Ctistis, Alex Hartsuiker, Edwin van der Pol, Julien Claudon, Willem L. Vos, Jean-Michel Gérard. 2010-11-10. Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam. https://doi.org/10.1103/physrevb.82.195330

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