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arXiv · 1106.4949

Efficient Quasiparticle Evacuation in Superconducting Devices

Sukumar Rajauria·L. M. A. Pascal·Ph. Gandit·F. W. J. Hekking·B. Pannetier·H. Courtois
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Abstract

We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.

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Sukumar Rajauria, L. M. A. Pascal, Ph. Gandit, F. W. J. Hekking, B. Pannetier, H. Courtois. 2011-06-24. Efficient Quasiparticle Evacuation in Superconducting Devices. https://doi.org/10.1103/physrevb.85.020505

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