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arXiv · 1108.0850

Diamond Processing by Focused Ion Beam - Surface Damage and Recovery

Igal Bayn·Asaf Bolker·Catherine Cytermann·Boris Meyler·Vladimir Richter·Joseph Salzman·Rafi Kalish
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Abstract

The Nitrogen Vacancy color center (NV-) in diamond is of great interest for novel photonic applications. Diamond nano-photonic structures are often implemented using Focused-Ion-Beam (FIB) processing, leaving a damaged surface which has a detrimental effect on the color center luminescence. The FIB processing effect on single crystal diamond surfaces and their photonic properties is studied by Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and photoluminescence (PL). Exposing the processed surface to hydrogen plasma, followed by chemical etching, drastically decreases implanted Ga concentration, resulting in a recovery of the NV- photo-emission and in a significant increase of the NV-/NV0 ratio.

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Igal Bayn, Asaf Bolker, Catherine Cytermann, Boris Meyler, Vladimir Richter, Joseph Salzman, Rafi Kalish. 2011-08-03. Diamond Processing by Focused Ion Beam - Surface Damage and Recovery. https://doi.org/10.1063/1.3658631

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