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arXiv · 1304.0955

Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy

A. G. Touryanski·V. M. Senkov·S. S. Gizha·L. V. Arapkina·V. A. Chapnin·K. V. Chizh·V. P. Kalinushkin·M. S. Storozhevykh·O. V. Uvarov·V. A. Yuryev
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Abstract

Application of the two-wavelength X-ray reflectometry to exploration of Ge/Si(001) hereostructures with dense chains of stacked Ge quantum dots is presented

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A. G. Touryanski, V. M. Senkov, S. S. Gizha, L. V. Arapkina, V. A. Chapnin, K. V. Chizh, V. P. Kalinushkin, M. S. Storozhevykh, O. V. Uvarov, V. A. Yuryev. 2013-04-03. Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy. https://arxiv.org/abs/1304.0955

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