arXiv · 1305.0106
Scanning Gate Microscopy of Kondo Dots: Fabry-P\'erot Interferences and Thermally Induced Rings
Abstract
We study the conductance of an electron interferometer formed in a two dimensional electron gas between a nanostructured quantum contact and the charged tip of a scanning gate microscope. Measuring the conductance as a function of the tip position, thermally induced rings may be observed in addition to Fabry-P\'erot interference fringes spaced by half the Fermi wavelength. If the contact is made of a quantum dot opened in the middle of a Kondo valley, we show how the location of the rings allows to measure by electron interferometry the magnetic moment of the dot above the Kondo temperature.
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Andrii Kleshchonok, Geneviève Fleury, Jean-Louis Pichard. 2013-05-01. Scanning Gate Microscopy of Kondo Dots: Fabry-P\'erot Interferences and Thermally Induced Rings. https://arxiv.org/abs/1305.0106
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