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arXiv · 1307.6078

Resonator Power to Frequency Conversion in a Cryogenic Sapphire Oscillator

Nitin R. Nand·Stephen R. Parker·Eugene N. Ivanov·Jean-Michel le-Floch·John G. Hartnett·Michael E. Tobar
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Abstract

We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator leads to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.

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Nitin R. Nand, Stephen R. Parker, Eugene N. Ivanov, Jean-Michel le-Floch, John G. Hartnett, Michael E. Tobar. 2013-07-23. Resonator Power to Frequency Conversion in a Cryogenic Sapphire Oscillator. https://doi.org/10.1063/1.4816284

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