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arXiv · 1308.5082

Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities

Nikolay Bagraev·Eduard Danilovskii·Wolfgang Gehlhoff·Dmitrii Gets·Leonid Klyachkin·Andrey Kudryavtsev·Roman Kuzmin·Anna Malyarenko·Vladimir Mashkov·Vladimir Romanov
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Abstract

We present the first findings of the new electrically-detected electron spin resonance technique (EDESR), which reveal the point defects in the ultra-narrow silicon quantum wells (Si-QW) confined by the superconductor delta-barriers. This technique allows the ESR identification without application of an external cavity, as well as a high frequency source and recorder, and with measuring the only response of the magnetoresistance, with internal GHz Josephson emission within frameworks of the normal-mode coupling (NMC) caused by the microcavities embedded in the Si-QW plane.

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Nikolay Bagraev, Eduard Danilovskii, Wolfgang Gehlhoff, Dmitrii Gets, Leonid Klyachkin, Andrey Kudryavtsev, Roman Kuzmin, Anna Malyarenko, Vladimir Mashkov, Vladimir Romanov. 2013-08-23. Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities. https://doi.org/10.1063/1.4865648

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