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arXiv · 1310.6634

Application of Scanning Mid-IR-Laser Microscopy for Characterization of Semiconductor Materials for Photovoltaics

V. P. Kalinushkin·O. V. Astafiev·V. A. Yuryev
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Abstract

The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfully applied for the investigation of CZ Si$_x$Ge$_{1-x}$---a promising material for photovoltaics---and multicrystalline silicon for solar cells.

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V. P. Kalinushkin, O. V. Astafiev, V. A. Yuryev. 2013-10-24. Application of Scanning Mid-IR-Laser Microscopy for Characterization of Semiconductor Materials for Photovoltaics. https://arxiv.org/abs/1310.6634

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