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arXiv · 1405.6501

A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements

Thomas Schneider·Dominique Leduc·Cyril Lupi·Julien Cardin·Hartmut Gundel·Christian Boisrobert
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Abstract

We consider three layer optical waveguides and present a method to measure simultaneously the refractive index and the thickness of each layer with m-lines spectroscopy. We establish the three layer waveguide modal dispersion equations and describe a numerical method to solve these equations. The accuracy of the method is evaluated by numerical simulations with noisy data and experimentally demonstrated using a PZT thin film placed between two ZnO layers.

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Thomas Schneider, Dominique Leduc, Cyril Lupi, Julien Cardin, Hartmut Gundel, Christian Boisrobert. 2014-05-26. A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements. https://doi.org/10.1063/1.2885147

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