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arXiv · 1407.2303

Gemini Planet Imager Observational Calibrations III: Empirical Measurement Methods and Applications of High-Resolution Microlens PSFs

Patrick Ingraham·Jean-Baptiste Ruffio·Marshall D. Perrin·Schuyler G. Wolff·Zachary H. Draper·Jerome Maire·Franck Marchis·Vincent Fesquet
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Abstract

The newly commissioned Gemini Planet Imager (GPI) combines extreme adaptive optics, an advanced coronagraph, precision wavefront control and a lenslet-based integral field spectrograph (IFS) to measure the spectra of young extrasolar giant planets between 0.9-2.5 um. Each GPI detector image, when in spectral model, consists of ~37,000 microspectra which are under or critically sampled in the spatial direction. This paper demonstrates how to obtain high-resolution microlens PSFs and discusses their use in enhancing the wavelength calibration, flexure compensation and spectral extraction. This method is generally applicable to any lenslet-based integral field spectrograph including proposed future instrument concepts for space missions.

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Patrick Ingraham, Jean-Baptiste Ruffio, Marshall D. Perrin, Schuyler G. Wolff, Zachary H. Draper, Jerome Maire, Franck Marchis, Vincent Fesquet. 2014-07-11. Gemini Planet Imager Observational Calibrations III: Empirical Measurement Methods and Applications of High-Resolution Microlens PSFs. https://doi.org/10.1117/12.2055283

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