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arXiv · 1409.2746

A simple and robust method for characterization of afterpulsing in single photon detectors

Gerhard Humer·Momtchil Peev·Christoph Schaeff·Sven Ramelow·Mario Stipčević·Rupert Ursin
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Abstract

Single photon detectors are important for a wide range of applications each with their own specific requirements, which makes necessary the precise characterization of detectors. Here, we present a simple and accurate methodology of characterizing dark count rate, detection efficiency, and after-pulsing in single photon detectors purely based on their counting statistics. We demonstrate our new method on a custom-made, free-running single photon detector based on an InGaAs based avalanche photo diode (APD), though the methodology presented here is applicable for any type of single photon detector.

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Gerhard Humer, Momtchil Peev, Christoph Schaeff, Sven Ramelow, Mario Stipčević, Rupert Ursin. 2014-09-22. A simple and robust method for characterization of afterpulsing in single photon detectors. https://doi.org/10.1109/jlt.2015.2428053

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