arXiv · 1412.4484
Resonant inelastic x-ray scattering spectrometer with 25 meV resolution at Cu K-edge
Abstract
An unparalleled resolution is reported with an inelastic x-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single crystal quartz (SiO_{2}) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray tracing simulation of an ideal spectrometer. We demonstrated the performance of the spectrometer by reproducing the phonon dispersion curve of a beryllium (Be) single crystal.
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Didem Ketenoglu, Manuel Harder, Konstantin Klementiev, Mary Upton, Mehran Taherkhani, Manfred Spiwek, Frank-Uwe Dill, Hans-Christian Wille, Hasan Yavaş. 2014-12-15. Resonant inelastic x-ray scattering spectrometer with 25 meV resolution at Cu K-edge. https://doi.org/10.1107/s1600577515009686
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