arXiv · 1503.06136
A more accurate measurement of the $^{28}$Si lattice parameter
Abstract
In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of $^{28}$Si {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value $d_{220}=192014711.98(34)$ am having a reduced uncertainty.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Enrico Massa, Carlo Paolo Sasso, Giovanni Mana, Carlo Palmisano. 2020-07-21. A more accurate measurement of the $^{28}$Si lattice parameter. https://doi.org/10.1063/1.4917488
Cite the original work for its findings. Save a collection to share your selection of sources.