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arXiv · 1503.06573

Spotting 2-D Atomic Layers on Aluminum Nitride Thin Films

Hareesh Chandrasekar·Krishna Bharadwaj B·Kranthi Kumar Vaidyuala·Swathi Suran·Navakanta Bhat·Manoj Varma·Srinivasan Raghavan
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Abstract

The availability of large-area substrates imposes an important constraint on the technological and commercial realization of devices made of layered materials. Aluminum nitride films on silicon are shown to be promising candidate materials as large-area substrates for such devices. Herein, the optical contrast of exemplar 2D layers - MoS2and graphene - on AlN films has been investigated as a necessary first step to realize devices on these substrates. Significant contrast enhancements are predicted and observed on AlN films compared to conventional SiO2films. Quantitative estimates of experimental contrast using reflectance spectroscopy show very good agreement with predicted values.

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Hareesh Chandrasekar, Krishna Bharadwaj B, Kranthi Kumar Vaidyuala, Swathi Suran, Navakanta Bhat, Manoj Varma, Srinivasan Raghavan. 2015-10-16. Spotting 2-D Atomic Layers on Aluminum Nitride Thin Films. https://doi.org/10.1088/0957-4484%2F26%2F42%2F425202

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