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arXiv · 1504.04519

Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach

G. I. Zebrev·K. S. Zemtsov·R. G. Useinov·M. S. Gorbunov·V. V. Emeliyanov·A. I. Ozerov
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Abstract

We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets in the nanoscale (with feature sizes less than 100 nm) memories.

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G. I. Zebrev, K. S. Zemtsov, R. G. Useinov, M. S. Gorbunov, V. V. Emeliyanov, A. I. Ozerov. 2015-04-17. Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach. https://arxiv.org/abs/1504.04519

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