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arXiv · 1505.04445

Near-field speckle-scanning-based x-ray imaging

Sebastien Berujon·Eric Ziegler
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Abstract

The x-ray near-field speckle-scanning concept is an approach recently introduced to obtain absorption, phase, and dark-field images of a sample. In this paper, we present ways of recovering from a sample its ultrasmall-angle x-ray scattering distribution using numerical deconvolution. We also show how to access the 2D phase gradient signal from random step scans, the latter having the potential to elude the flat-field correction error. Each feature is explained theoretically and demonstrated experimentally at a synchrotron x-ray facility.

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Sebastien Berujon, Eric Ziegler. 2015-07-23. Near-field speckle-scanning-based x-ray imaging. https://doi.org/10.1103/physreva.92.013837

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