arXiv subjects

Eric Ziegler

Publications and source records attributed to Eric Ziegler.

5 recordsLinked to original sources

arXiv2019

X-ray optics and beam characterisation using random modulation: Experiments

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.

physics.ins-det↗

arXiv2019

X-ray optics and beam characterization using random modulation: Theory

X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.

physics.optics↗

arXiv2016

Near-field speckle-scanning-based X-ray tomography

We previously demonstrated near-field speckle scanning based x-ray imaging to be an easy-to-implement phase sensing method capable of providing both high sensitivity and high resolution. Yet, this performance combination could only be achieved at the cost of a significant number of sample exposures and of extensive data acquisition time, thus tempering its implementation for tomography applications. Herein, we show ways of drastically lowering the number of exposures for the speckle scanning method to become attractive for computed tomography (CT) imaging. As the method presented can cope with a high divergence beam, it is also expected to attract the attention of the laboratory sources community.

physics.med-ph↗

arXiv2015

X-Ray Multimodal Tomography Using Speckle-Vector Tracking

We demonstrate computerized tomography (CT) reconstructions from absorption, phase and dark-field signals obtained from scans acquired when the x-ray probe light is modulated with speckle. Two different interlaced schemes are proposed to reduce the number of sample exposures. First, the already demonstrated x-ray speckle-vector tracking (XSVT) concept for projection imaging allows the three signal CT reconstructions from multiple images per projection. Second, a modified XSVT approach is shown to provide absorption and phase reconstructions, this time from a single image per angular projection. Reconstructions from data obtained at a synchrotron facility emphasize the potential of the approaches for the imaging of complex samples.

physics.optics↗

arXiv2015

Near-field speckle-scanning-based x-ray imaging

The x-ray near-field speckle-scanning concept is an approach recently introduced to obtain absorption, phase, and dark-field images of a sample. In this paper, we present ways of recovering from a sample its ultrasmall-angle x-ray scattering distribution using numerical deconvolution. We also show how to access the 2D phase gradient signal from random step scans, the latter having the potential to elude the flat-field correction error. Each feature is explained theoretically and demonstrated experimentally at a synchrotron x-ray facility.

physics.optics↗