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arXiv · 1505.07004

Spectroscopic detection of atom-surface interactions in an atomic vapour layer with nanoscale thickness

K. A. Whittaker·J. Keaveney·I. G. Hughes·A. Sargsyan·D. Sarkisyan·C. S. Adams
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Abstract

We measure the resonance line shape of atomic vapor layers with nanoscale thickness confined between two sapphire windows. The measurement is performed by scanning a probe laser through resonance and collecting the scattered light. The line shape is dominated by the effects of Dicke narrowing, self-broadening, and atom-surface interactions. By fitting the measured line shape to a simple model we discuss the possibility to extract information about the atom-surface interaction.

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K. A. Whittaker, J. Keaveney, I. G. Hughes, A. Sargsyan, D. Sarkisyan, C. S. Adams. 2015-05-26. Spectroscopic detection of atom-surface interactions in an atomic vapour layer with nanoscale thickness. https://doi.org/10.1103/physreva.92.052706

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