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arXiv · 1506.00561

Versatile AFM setup combined with micro-focused X-ray beam

T. Slobodskyy·A. V. Zozulya·R. Tholapi·L. Liefeith·M. Fester·M. Sprung·W. Hansen
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Abstract

Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure and performance of the setup are presented.

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T. Slobodskyy, A. V. Zozulya, R. Tholapi, L. Liefeith, M. Fester, M. Sprung, W. Hansen. 2015-06-01. Versatile AFM setup combined with micro-focused X-ray beam. https://arxiv.org/abs/1506.00561

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