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arXiv · 1506.07349

Bimodal Magnetic Force Microscopy with Capacitive Tip-Sample Distance Control

Johannes Schwenk·Xue Zhao·Mirko Baćani·Miguel A. Marioni·Sara Romer·Hans J. Hug
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Abstract

A single-passage, bimodal magnetic force microscopy technique optimized for scanning samples with arbitrary topography is discussed. A double phase-locked loop (PLL) system is used to mechanically excite a high quality factor cantilever under vacuum conditions on its first mode and via an oscillatory tip-sample potential on its second mode. The obtained second mode oscillation amplitude is then used as a proxy for the tip-sample distance, and for the control thereof. With appropriate $z$-feedback parameters two data sets reflecting the magnetic tip-sample interaction and the sample topography are simultaneously obtained.

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Johannes Schwenk, Xue Zhao, Mirko Baćani, Miguel A. Marioni, Sara Romer, Hans J. Hug. 2015-09-22. Bimodal Magnetic Force Microscopy with Capacitive Tip-Sample Distance Control. https://doi.org/10.1063/1.4932174

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