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arXiv · 1508.06312

Characterizing Universal Gate Sets via Dihedral Benchmarking

Arnaud Carignan-Dugas·Joel J. Wallman·Joseph Emerson
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Abstract

We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups, including gates in SU(2) associated with arbitrarily small angle rotations. Our dihedral benchmarking protocol is a generalization of randomized benchmarking that relaxes the usual unitary 2-design condition. Combining this protocol with existing randomized benchmarking schemes enables an efficient means of characterizing universal gate sets for quantum information processing in a way that is independent of state-preparation and measurement errors. In particular, our protocol enables direct benchmarking of the $T$ gate (sometime called $π/8$-gate) even for the gate-dependent error model that is expected in leading approaches to fault-tolerant quantum computation.

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Arnaud Carignan-Dugas, Joel J. Wallman, Joseph Emerson. 2025-08-13. Characterizing Universal Gate Sets via Dihedral Benchmarking. https://doi.org/10.1103/physreva.92.060302

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