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arXiv · 1508.06358

Optical gradient force nano-imaging and -spectroscopy

Honghua U. Yang·Markus B. Raschke
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Abstract

Nanoscale forces play an important role in different scanning probe microscopies, most notably atomic force microscopy (AFM). In contrast, in scanning near-field optical microscopy (SNOM) a light-induced coupled local optical polarization between tip and sample is typically detected by scattering to the far field. Measurements of the optical gradient force associated with that optical near-field excitation would offer a novel optical scanning probe modality. Here we provide a generalized theory of optical gradient force nano-imaging and -spectroscopy. We quantify magnitude and distance dependence of the optical gradient force and its spectral response. We show that the optical gradient force is dispersive for single particle electronic and vibrational resonances, distinct from recent claims of its experimental observation. In contrast, the force can be absorptive for collective resonances. We provide a guidance for its measurements and distinction from competing processes such as thermal expansion.

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Honghua U. Yang, Markus B. Raschke. 2015-08-26. Optical gradient force nano-imaging and -spectroscopy. https://arxiv.org/abs/1508.06358

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