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arXiv · 1512.09197

Devices for high precision x-ray beam intensity monitoring on BSRF

LI Hua-Peng·Kun Tang·Yi-Dong Zhao·Lei Zheng·Shu-Hu Liu·Xiao-Liang Zhao·Ya-Shuai Zhao
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Abstract

Synchrotron radiation with the characteristic of high brilliance, high level of polarization, high collimation, low emittance and wide tunability in energy has been used as a standard source in metrology(1, 2). For a decade, lots of calibration work have been done on 4B7A in Beijing Synchrotron Radiation Facility (BSRF) (3, 4). For the calibration process, a high-precision online monitor is indispensable. To control the uncertainty under 0.1%, we studied different sizes parallel ion chambers with rare-gas and used different collecting methods to monitor the x-ray intensity of the beamline. Two methods to collect the signal of the ion chambers: reading the current directly with electrometer or signal amplification to collect the counts were compared.

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LI Hua-Peng, Kun Tang, Yi-Dong Zhao, Lei Zheng, Shu-Hu Liu, Xiao-Liang Zhao, Ya-Shuai Zhao. 2015-12-31. Devices for high precision x-ray beam intensity monitoring on BSRF. https://arxiv.org/abs/1512.09197

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