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arXiv · 1606.03517

Thermal x-ray diffraction and near-field phase contrast imaging

Zheng Li·Anton Classen·Tao Peng·Nikita Medvedev·Fenglin Wang·Henry N. Chapman·Yanhua Shih
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Abstract

Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. In this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs.

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Zheng Li, Anton Classen, Tao Peng, Nikita Medvedev, Fenglin Wang, Henry N. Chapman, Yanhua Shih. 2016-06-11. Thermal x-ray diffraction and near-field phase contrast imaging. https://doi.org/10.1209/0295-5075/120/16003

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