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arXiv · 1607.00911

Measuring the Nonlinear Refractive Index of Graphene using the Optical Kerr Effect Method

Evdokia Dremetsika·Bruno Dlubak·Simon-Pierre Gorza·Charles Ciret·Marie-Blandine Martin·Stephan Hofmann·Pierre Seneor·Daniel Dolfi·Serge Massar·Philippe Emplit·Pascal Kockaert
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Abstract

By means of the ultrafast optical Kerr effect method coupled to optical heterodyne detection (OHD-OKE), we characterize the third order nonlinear response of graphene at telecom wavelength, and compare it to experimental values obtained by the Z-scan method on the same samples. From these measurements, we estimate a negative nonlinear refractive index for monolayer graphene, $n_2 = - 1.1\times 10^{-13} m^2/W$. This is in contradiction to previously reported values, which leads us to compare our experimental measurements obtained by the OHD-OKE and the Z-scan method with theoretical and experimental values found in the literature, and to discuss the discrepancies, taking into account parameters such as doping.

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Evdokia Dremetsika, Bruno Dlubak, Simon-Pierre Gorza, Charles Ciret, Marie-Blandine Martin, Stephan Hofmann, Pierre Seneor, Daniel Dolfi, Serge Massar, Philippe Emplit, Pascal Kockaert. 2016-07-04. Measuring the Nonlinear Refractive Index of Graphene using the Optical Kerr Effect Method. https://doi.org/10.1364/ol.41.003281

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