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Evdokia Dremetsika

Publications and source records attributed to Evdokia Dremetsika.

3 recordsLinked to original sources

Electrodynamic models of 2D materials: can we match thin film and single sheet approaches?

The electromagnetic properties of 2D materials are modeled either as single sheets with a surface susceptibility or conductivity, or as thin films of finite thickness with an effective permittivity. Their intrinsic anisotropy, however, has to be fully described to reliably predict the optical response of systems based on 2D materials or to unambiguously interpret experimental data. In the present work, we compare the two approaches within the transfer matrix formalism and provide analytical relations between them. We strongly emphasize the consequences of the anisotropy. In particular, we demonstrate the crucial role of the choice of the thin film's effective thickness compared with the parameters of the single sheet approach and therefore the computed properties of the 2D material under study. Indeed, if the isotropic thin film model with very low thickness is similar to an anisotropic single sheet with no out-of-plane response, with larger thickness it matches with a single sheet with isotropic susceptibility, in the reasonable small phase condition. We illustrate our conclusions on extensively studied experimental quantities such as transmittance, ellipsometry and optical contrast, and we discuss similarities and discrepancies reported in the literature when using single sheet or thin film models.

physics.optics

Enhanced optical Kerr effect method for a detailed characterization of the third order nonlinearity of 2D materials applied to graphene

Using an enhanced optically heterodyned optical Kerr effect method and a theoretical description of the interactions between an optical beam, a single layer of graphene, and its substrate, we provide experimental answers to questions raised by theoretical models of graphene third-order nonlinear optical response. In particular, we measure separately the time response of the two main tensor components of the nonlinear susceptibility, we validate the assumption that the out-of plane tensor components are small, and we quantify the optical impact of the substrate on the measured coefficients. Our method can be applied to other 2D materials, as it relies mainly on the small ratio between the thickness and the wavelength.

physics.optics

Measuring the Nonlinear Refractive Index of Graphene using the Optical Kerr Effect Method

By means of the ultrafast optical Kerr effect method coupled to optical heterodyne detection (OHD-OKE), we characterize the third order nonlinear response of graphene at telecom wavelength, and compare it to experimental values obtained by the Z-scan method on the same samples. From these measurements, we estimate a negative nonlinear refractive index for monolayer graphene, $n_2 = - 1.1\times 10^{-13} m^2/W$. This is in contradiction to previously reported values, which leads us to compare our experimental measurements obtained by the OHD-OKE and the Z-scan method with theoretical and experimental values found in the literature, and to discuss the discrepancies, taking into account parameters such as doping.

physics.optics